分类: 光学 >> 量子光学 提交时间: 2023-02-19
摘要: The optical bistability have been studied theoretically in a multi-mode optomechanical system with two mechanical oscillators independently coupled to two cavities in addition to direct tunnel coupling between cavities. It is proved that the bistable behavior of mean intracavity photon number in the right cavity can be tuned by adjusting the strength of the pump laser beam driving the left cavity. And the mean intracavity photon number is relatively larger in the red sideband regime than that in the blue sideband regime. Moreover, we have shown that the double optical bistability of intracavity photon in the right cavity and the two steady-state positions of mechanical resonators can be observed when the control field power is increased to a critical value. Besides, the critical values for observing bistability and double bistability can be tuned by adjusting the coupling coefficient between two cavities and the coupling rates between cavities mode and mechanical mode.
分类: 光学 >> 量子光学 提交时间: 2023-02-19
摘要: We report that flat substrates such as glass coverslips with surface roughness well below 0.5 nm feature notable speckle patterns when observed with high-sensitivity interference microscopy. We uncover that these speckle patterns unambiguously originate from the subnanometer surface undulations, and develop an intuitive model to illustrate how subnanometer non-resonant dielectric features could generate pronounced interference contrast in the far field. We introduce the concept of optical fingerprint for the deterministic speckle pattern associated with a particular substrate surface area and intentionally enhance the speckle amplitudes for potential applications. We demonstrate such optical fingerprints can be leveraged for reproducible position identification and marker-free lateral displacement detection with an experimental precision of 0.22 nm. The reproducible position identification allows us to detect new nanoscopic features developed during laborious processes performed outside of the microscope. The demonstrated capability for ultrasensitive displacement detection may find applications in the semiconductor industry and super-resolution optical microscopy.